SINGH, P.; SHREE, R. Statistical Quality Analysis of Wavelet Based SAR Images in Despeckling Process. Asian Journal of Electrical Sciences, [S. l.], v. 6, n. 2, p. 1–18, 2017. DOI: 10.51983/ajes-2017.6.2.2001. Disponível em: https://ojs.trp.org.in/index.php/ajes/article/view/2001. Acesso em: 24 nov. 2024.