THIRUKRISHNA, J. T.; SUPRIYA, M. R.; ROHINI, M.; NISHMITHA; NITHYA SHREE, M. Review of Disaster Defect Management in Machine Learning. Asian Journal of Electrical Sciences, [S. l.], v. 12, n. 2, p. 10–14, 2023. DOI: 10.51983/ajes-2023.12.2.3946. Disponível em: https://ojs.trp.org.in/index.php/ajes/article/view/3946. Acesso em: 3 jul. 2024.