Reordering of Test Vectors Using Weighting Factor Based on Average Power for Test Power Minimization

Authors

  • M. Vidhyia Assistant professor, Department of ECE, AVS Engineering College, Salem, Tamil Nadu, India
  • K. Paramasivam Professor, Department of ECE, KSR College of engineering, Thiruchengode, Tamil Nadu, India
  • S. Elayaraja Asst Professor(Sr.G), Department of Civil Engineering, PSG Institute of Technology & Applied Research, Coimbatore, Tamil Nadu, India
  • S. Bharathiraja Asst Professor, Department of Civil Engineering, Paavai college of Technology, Namakkal, Tamil Nadu, India

DOI:

https://doi.org/10.51983/ajes-2015.4.2.1950

Keywords:

Weighted Switching Activity, Test Power, Reordering, Power dissipation, Power matrix

Abstract

Power consumption is one of the biggest challenges in high performance VLSI design and testing. Low power VLSI circuits dissipate more power during testing when compared with that of normal operation. Dynamic power has been the dominant part of power dissipation in CMOS circuits; however, in future technologies the static portion of power dissipation will outreach the dynamic portion. The proposed approach is based on a reordering of test vectors in the test sequence to minimize the switching activity of the circuit using test application. In this paper weighted switching activity is derived based on the average power consumed in the logic gates during all possible event conditions. Since this weighted switching activity is based on the power, which gives more accurate results. The proposed algorithm is implemented and verified using ISCAS85 benchmark circuits. Power is estimated for the circuits using Tanner EDA tool. The results show that power is reduced significantly over the existing methods

References

P.Girard, C. Landrault, S. Pravossoudovitch and D. Severac, “Reducing Power Consumption during Test Application by Test Vector Ordering “, IEEE Int. Symp. on Circuits and Systems, CD-Rom proceedings, June 1998.

M.Abramovici, M.A. Breuer and A.D. Friedman,“Digital Systems Testing and Testable Design”, Computer Science Press, 1990.

Fadi A. Aloul and Assim Sagahyroon , “ Estimation of the Weighted Switching Activity in Combinational

CMOS Circuits”, American University of Sharjah, U.A.E

P.Girard, L.Guiller, C. Landrault and S. Pravossoudovitch, “A Test Vector Ordering Technique for Switching Activity Reduction during Test Operation “, IEEE Great Lakes Symp. on VLSI, pp. 24-27, March 1999

V. Dabholkar, S.Chakravarty I. Pomeranz and S.M. Reddy, “Techniques for Reducing Power Dissipation During Test Application in Full Scan circuits”,IEEE Transactions on CAD, Vol. 17,N” 12, pp. 1325-1333,December 1998.

P. Girad, L. Guiller, C. Landrault and S. Pravossoudovitch, “A test vector inhibiting technique for low energy BIST design,” in Proc. VLSI Test Symp.,Apr 1999, pp. 407-412.

S. Chattopadhyay and N. Choudhary, “Genetic Algorithm based Approach for Low Power Combinational circuit Testing” 16th IEEE International Conference on VLSI Design, January 4.8.2003, pp. 552-557.

S. Chattopadhyay, “Reordering Test Pattern with Don’t Cares for Minimizing Power Dissipation During Combinational Circuit Testing”, Proc. Of Fourth International Conference on Information Technology, December 2001, pp. 260-264.

P.Girard, L.Guiller, C. Landrault, S. Pravossoudovitch, J.Figueras, S.Manich, P. Teixeira and M. Santos, “Low Energy BIST Design: Impact of the LFSR TPG Parameters on the Weighted Switching Activity”, IEEE Int. Symp. on Circuits and Systems, CD-ROM proceedings, June 1999.

David Bryan, “The ISCAS ’85 Benchmark Circuits and Net list Format” North Carolina State University, 1985.

K.Paramasivam, K.Gunavathi, “Reordering Algorithm for Minimizing Test Power in VLSI Circuits”, 12 February 2007

Kuppusamy Paramasivam, and K.Gunavathi, “Switching Activity Based Method for Minimizing Testing Power in Digital Circuits”February2007.

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Published

05-11-2015

How to Cite

Vidhyia, M., K. Paramasivam, S. Elayaraja, & S. Bharathiraja. (2015). Reordering of Test Vectors Using Weighting Factor Based on Average Power for Test Power Minimization. Asian Journal of Electrical Sciences, 4(2), 10–15. https://doi.org/10.51983/ajes-2015.4.2.1950